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講義 Noise in Materials and Components Low frequency noise as a diagnostic tool for reliability and quality assessment of electronic devices L.K.J. Vandamme Eindhoven University of Technology (EH 9.13) 5600 MB Eindhoven, The Netherlands L.K.J.Vandamme@tue.nl Pisa, March 2005 
noise in semiconductor.pdf
(5.61 MB)
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